Atomic Force Microscope



Park Systems Corp., Korea.


XE -100





5µm and 100 µm

Noise level


Microscope field view

480 x360 µm


Atomic Force Microscopy is a method for high resolution surface imaging. The AFM gives us a window into this nanoscale world. It uses a cantilever with a very sharp tip to scan over a sample surface. As the tip approaches the surface, the close-range, attractive force between the surface and the tip cause the cantilever to deflect towards the surface.

Measurement: Surface scanning contact and non contact mode.




Sample thickness :1 cm maximum







National Lab/R&D's



Rs. 5000/-  Per Sample

Rs. 5000/-  Per Sample

Rs. 5000/-  Per Sample

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