CIFT

Atomic Force Microscope

               

Make

Park Systems Corp., Korea.

Model

XE -100

 

     

 

Scanner

5µm and 100 µm

Noise level

 0.02nm

Microscope field view

480 x360 µm

 

Atomic Force Microscopy is a method for high resolution surface imaging. The AFM gives us a window into this nanoscale world. It uses a cantilever with a very sharp tip to scan over a sample surface. As the tip approaches the surface, the close-range, attractive force between the surface and the tip cause the cantilever to deflect towards the surface.

Measurement: Surface scanning contact and non contact mode.

 

 

 

Sample thickness :1 cm maximum

 

 

 

 

Industry

University

National Lab/R&D's

 

              

Rs. 5000/-  Per Sample

Rs. 5000/-  Per Sample

Rs. 5000/-  Per Sample

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